Several state-of-the-art instruments enable the synthesis, irradiation, functionalization, and analysis of samples:

• X-ray photoelectron spectroscopy (XPS)
• Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)
• Ion beam analysis (IBA)
• Ion beam functionalization (IBMM)
• Plasma treatment (PECVD, DC, RF, and AC)