Learning outcomes

This course is designed to familiarise students with the various techniques of surface and interface analysis using electron beams and low and high energy ion beams.

Goals

To provide students of the Master in Physics in FA with a theoretical knowledge of the main methods of surface and interface analysis, used for academic and industrial research.

Content

Low energy electron and ion spectrosopies (L. Houssiau, 15h)

  1. X-ray photoelectron spectroscopy (XPS)
  2. Auger electron spectroscopy (AES)
  3. Secondary ion mass spectrometry (SIMS and ToF-SIMS)
  4. Low energy ion scattering (LEIS)

High energy ion spectrometry (J. Colaux, 15h)

  1. Ion matter interaction (energy loss, straggling, cross-section)
  2. Rutherford Backscattering Spectrometry (RBS)
  3. Elastic Recoil Detection (ERD)
  4. (Resonant) Nuclear Reaction Analysis (NRA or RNRA)
  5. Particle-Induced X- or Gamma-ray Emission (PIXE or PIGE)
  6. Radiation or particle detection

Assessment method

The evaluation of the part on low energy electron and ion spectrocopies given by L. Houssiau will be done in the form of an oral exam with preparation.

The evaluation of the high-energy ion spectrometry part given by J. Colaux will take the form of an oral examination with preparation (in January or August).

Sources, references and any support material

Nuclear Physics Part 1 (G. Terwagne - Librairie des Sciences, FUNDP) Nuclear Physics Part 2 (G. Terwagne - Librairie des Sciences, FUNDP) - Librairie des Sciences, FUNDP)

Language of instruction

Français
Training Study programme Block Credits Mandatory
Specialised Master in Nanotechnology Standard 0 3
Master in Physics, Research focus Standard 0 3
Specialised Master in Nanotechnology Standard 1 3
Master in Physics, Research focus Standard 1 3