This event will provide students, researchers, and industry representatives with an opportunity to explore the evolution of electron microscopy, deepen their understanding of advanced analysis techniques, and participate in live demonstrations in a real research environment.

The program includes expert lectures on electron microscopy and analysis methods (EDS, EBSD, detectors), live SEM demonstrations, and a guided tour of the laboratory.

Participants will have the opportunity to interact with JEOL specialists and the electron microscopy platform during hands-on sessions and networking opportunities.

The event offers 1 ECTS credit to doctoral researchers and a certificate of participation upon request.

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