This course is designed to familiarise students with the various techniques of surface and interface analysis using electron beams and low and high energy ion beams.
To provide students of the Master in Physics in FA with a theoretical knowledge of the main methods of surface and interface analysis, used for academic and industrial research.
Low energy electron and ion spectrosopies (L. Houssiau; 50% of the overall score)
High energy ion spectrometry (J. Colaux; 50% of the overall score)
Lecture, illustrated mainly by PowerPoint presentations.
Low energy electron and ion spectrosopies (L. Houssiau, 15h)
The evaluation will be done in the form of an oral exam with preparation.
High energy ion spectrometry (J. Colaux, 15h)
The oral exam is held during the exam session and consists of a discussion based on a scientific article dealing with the analysis of specimens using high-energy ion beams. The topic of the article is open (e.g., materials science, heritage science, metrology, life sciences, geology…), provided the article was published within the last ten years.
Each student selects an article from the scientific literature and submits it to J. Colaux for approval no later than the last day of the relevant term. The same article may not be chosen by more than one student.
The assessment focuses on a critical discussion of the methodological and scientific choices made by the authors, based on a presentation prepared in advance (PowerPoint or equivalent).
Nuclear Physics Part 1 (G. Terwagne - Librairie des Sciences, FUNDP) Nuclear Physics Part 2 (G. Terwagne - Librairie des Sciences, FUNDP) - Librairie des Sciences, FUNDP)
| Training | Study programme | Block | Credits | Mandatory |
|---|---|---|---|---|
| Advanced Master in Nanotechnology | Standard | 0 | 3 | |
| Master in Physics, Research focus | Standard | 0 | 3 | |
| Advanced Master in Nanotechnology | Standard | 1 | 3 | |
| Master in Physics, Research focus | Standard | 1 | 3 |